Secondary electron emission characteristics of graphene films with copper substrate

Jie Wang; Yong Wang; Yanhui Xu; Yuxin Zhang; Bo Zhang; Wei Wei

doi:10.1088/1674-1137/40/11/117003

Chinese Physics C> 2016, Vol. 40> Issue(11) : 117003 DOI: 10.1088/1674-1137/40/11/117003

Secondary electron emission characteristics of graphene films with copper substrate

1.
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China

Abstract
HTML
Reference
Related

PDF

Abstract：
For modern and future circular accelerators, especially high-intensity proton synchrotrons or colliders, the electron cloud effect is a key issue. So, in order to reduce the electron cloud effect, exploring very low secondary electron yield (SEY) material or coating used in vacuum tubes becomes necessary. In this article, we studied the SEY characteristics of graphene films with different thicknesses which were deposited on copper substrates using chemical vapor deposition. The SEY tests were done at temperatures of 25℃ and vacuum pressure of (2-6)×10^-9 torr. The properties of the deposited graphene films were investigated by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. The SEY curves show that the number of graphene layers has a great effect on the SEY of graphene films. The maximum SEY of graphene films decreases with the increase of the number of layers. The maximum SEY of 6-8 layers of graphene film is 1.25. These results have a great significance for next-generation particle accelerators.
- secondary electron yield ,
- graphene films ,
- low SEY film

References

[1]	M. Alberti et al, Phys. Status Solidi C, 9(6): 1501-1503(2012)
[2]	C. Yin Vallgren et al, Proceedings of IPAC' 10 (Kyoto, Japan), TUPD04
[3]	C. Yin Vallgren et al, PHYS REV SPEC TOP-AC, 14: 071001(2011)
[4]	CEPC-SPPC Preliminary Conceptual Design Report(Volume II-Accelerator, The CEPC-SPPC Study Group, March 2015)
[5]	A. K. Geim and K S. Novoselov, Nature Materials, 6(3): 183-191(2007)
[6]	R. Nair et al, Science, 320 (5881): 1308(2008)
[7]	K. S. Novoselov et al, Science, 306 (5696): 666-669(2004)
[8]	Liqiong Peng et al, Journal of Functional Materials, 44 (21): 3055-3059(2013)
[9]	Chaozhi Yu et al, Journal of Functional Materials, 45 (12): 12033-12041(2014)
[10]	Yusuke Suetsugu et al, J. Vac. Sci. Technol. A, 34(2): (2016)
[11]	R. Cimino et al, Proceedings of IPAC2014 (Dresden, Germany) WEPME033
[12]	C. Garion et al, IOP Conf. Series: Materials Science and Engineering 102, 012013(2015)
[13]	N. Hilleret et al, Appl. Phys. A, 76: 1085(2003)
[14]	C. Scheuerleina et al, Applied Surface Science, 202: 57-67(2002)
[15]	R. Cimino et al, Phys. Rev. Lett., 109: 064801(2012)
[16]	R.E. Kirby and F.K. King, Nuclear Instruments and Methods in Physics Research A, 469: 1-12(2001)
[17]	Reza Valizadeh et al, Applied Physics Letters, 105: 231605(2014)
[18]	R.Cimino et al, Phys. Rev. Lett., 93: 14801-1(2004)
[19]	Jingyu Tang et al, arXiv: 1507.03224
[20]	Isabel Montero et al, Applied Surface Science 291: 74-77(2014)
[21]	Jun Luo et al, American Chemical Society NANO, 5(2): 1047-1055(2011)

[1]	Yi-Qing Guo , Hong-Bo Hu , Zhen Tian . On the contribution of a hard galactic plane component to the excesses of secondary particles. Chinese Physics C, 2016, 40(11): 115001. doi: 10.1088/1674-1137/40/11/115001
[2]	Shuang Ma , Ming-Wu Wen , Zhan-Shan Wang . Thermal stability and separation characteristics of anti-sticking layers of Pt/Cr films for the hot slumping technique. Chinese Physics C, 2016, 40(7): 079001. doi: 10.1088/1674-1137/40/7/079001
[3]	YE Xing-Chen , YU Bo-Xiang , ZHOU Xiang , ZHAO L , DING Ya-Yun , LIU Meng-Chao , DING Xue-Feng , ZHANG Xuan , JIE Quan-Lin , FANG Jian , CHEN Hai-Tao , HU Wei , NIU Shun-Li , YAN Jia-Qing , ZHAO Hang , HONG Dao-Jin , . Preliminary study of light yield dependence on LAB liquidscintillator composition. Chinese Physics C, 2015, 39(9): 096003. doi: 10.1088/1674-1137/39/9/096003
[4]	DING Xue-Feng , WEN Liang-Jian , ZHOU Xiang , DING Ya-Yun , YE Xing-Chen , ZHOU Li , LIU Meng-Chao , CAI Hao , CAO Jun . Measurement of the fluorescence quantum yield of bis-MSB. Chinese Physics C, 2015, 39(12): 126001. doi: 10.1088/1674-1137/39/12/126001
[5]	WANG Jie , ZHANG Bo , XU Yan-Hui , WEI Wei , FAN Le , PEI Xiang-Tao , HONG Yuan-Zhi , WANG Yong . Deposition and characterization of TiZrV-Pd thin films by dc magnetron sputtering. Chinese Physics C, 2015, 39(12): 127007. doi: 10.1088/1674-1137/39/12/127007
[6]	FU Tao , AN Zhu , ZHU Jing-Jun , LIU Man-Tian , MAO Li . Tritium and helium analyses in thin films by enhancedproton backscattering. Chinese Physics C, 2014, 38(8): 088203. doi: 10.1088/1674-1137/38/8/088203
[7]	HUANG Jiang , XIONG Yong-Qian , CHEN De-Zhi , LIU Kai-Feng , YANG Jun , LI Dong , YU Tiao-Qin , FAN Ming-Wu , YANG Bo . A permanent magnet electron beam spread system used fora low energy electron irradiation accelerator. Chinese Physics C, 2014, 38(10): 107008. doi: 10.1088/1674-1137/38/10/107008
[8]	B. Spataro , A. Marcelli , S. Sarti , V. A. Dolgashev , S. Tantawi , A. D. Yeremian , M. G. Grimaldi , L. Romano , F. Ruffino , R. Parodi , G. Cibin , C. Marrelli , M. Migliorati , C. Caliendo0 . Molybdenum sputtering film characterization for high gradient accelerating structures. Chinese Physics C, 2013, 37(9): 097005. doi: 10.1088/1674-1137/37/9/097005
[9]	GUAN Liang , TANG Hao-Hui , GUO Jun-Jun , WANG Xiao-Lian , XU Zi-Zong , ZHAO Tian-Chi . Micromegas prototypes with thermo-bond film separators. Chinese Physics C, 2011, 35(2): 163-168. doi: 10.1088/1674-1137/35/2/011
[10]	Mahnaz Q , Samina S . Two loop low temperature corrections to electron self energy. Chinese Physics C, 2011, 35(7): 608-611. doi: 10.1088/1674-1137/35/7/002
[11]	ZHENG Lei , ZHAO Yi-Dong , TANG Kun , MA Chen-Yan , HAN Yong , CUI Ming-Qi . Total electron yield mode for XANES measurements in the energy region of 2.1--6.0 keV. Chinese Physics C, 2011, 35(2): 199-202. doi: 10.1088/1674-1137/35/2/018
[12]	TU Xiao-Lin , WANG Meng , HU Zheng-Guo , XU Hu-Shan , GUO Zhong-Yan , MAO Rui-Shi , XIAO Guo-Qing , ZHANG Hong-Bin , ZANG Yong-Dong , YUE Ke . Secondary electron time detector for mass measurements at CSRe. Chinese Physics C, 2010, 34(3): 363-367. doi: 10.1088/1674-1137/34/3/011
[13]	ZHANG Zhe , QIN Xiu-Bo , WANG Dan-Ni , YU Run-Sheng , WANG Qiao-Zhan , MA Yan-Yun , WANG Bao-Yi . Identification of pore size in porous SiO₂ thin film by positron annihilation. Chinese Physics C, 2009, 33(2): 156-160. doi: 10.1088/1674-1137/33/2/015
[14]	ZHAI Zhang-Yin , WU Xiao-Shan , JIA Quan-Jie . High resolution X-ray diffraction investigation of epitaxially grown SrTiO₃ thin films by laser-MBE. Chinese Physics C, 2009, 33(11): 949-953. doi: 10.1088/1674-1137/33/11/004
[15]	DENG Ju-Zhi , CHEN Rong , SEKIGUCHI Tetsuhiro , BABA Yuji , HIRAO Norie , HONDA Mitsunori . Synchrotron radiation studies of the orientation of thin silicon phthalocyanine dichloride film on HOPG substrate. Chinese Physics C, 2008, 32(9): 769-772. doi: 10.1088/1674-1137/32/9/018
[16]	ZHANG Yao-Feng , WANG Yong , WEI Wei , WANG Jian-Ping , FAN Le , GUAN Chang-Ying , LIU Zu-Ping . Secondary Electron Yield Studies on Vacuum Materials. Chinese Physics C, 2008, 32(S1): 68-70.
[17]	Zhao Weiqin , Liu Bo . Transverse Energy Dependence of Yield of Charmonium Production in Relativistic Heavy Ion Collisions. Chinese Physics C, 1995, 19(S1): 97-101.
[18]	Li Qiang , Wei Zengquan , Ma Shouwu . Frequency Distributions of Energy Deposition in a Low-Energy Electron Track. Chinese Physics C, 1995, 19(S4): 369-373.
[19]	Liu Bo , Jiang Huanqing . The K⁺/π⁺ Ratio in High-Energy Nucleus Collisions and the Effect of Secondary Collisions. Chinese Physics C, 1993, 17(S4): 403-409.
[20]	Qiu Jinfa . The Background Darkness of X-Ray Films and Energy Calibration in an EC Experiment. Chinese Physics C, 1989, 13(S4): 363-370.

Access

Get Citation

Jie Wang, Yong Wang, Yanhui Xu, Yuxin Zhang, Bo Zhang and Wei Wei. Secondary electron emission characteristics of graphene films with copper substrate[J]. Chinese Physics C, 2016, 40(11): 117003. doi: 10.1088/1674-1137/40/11/117003

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 2016-03-17
Revised: 2016-07-10

Fund

Supported by the National Natural Science Foundation of China (11475166) National Natural Science Foundation of China (11205155) and National Natural Science Foundation of China (11575214)

Article Metric

Article Views(1737)
PDF Downloads(93)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

Secondary electron emission characteristics of graphene films with copper substrate

Corresponding author: Yong Wang,

Corresponding author: Bo Zhang,

1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China

Received Date: 2016-03-17

Accepted Date: 2016-07-10

Available Online: 2016-11-05

Fund Project: Supported by the National Natural Science Foundation of China (11475166) National Natural Science Foundation of China (11205155) and National Natural Science Foundation of China (11575214)

Abstract: For modern and future circular accelerators, especially high-intensity proton synchrotrons or colliders, the electron cloud effect is a key issue. So, in order to reduce the electron cloud effect, exploring very low secondary electron yield (SEY) material or coating used in vacuum tubes becomes necessary. In this article, we studied the SEY characteristics of graphene films with different thicknesses which were deposited on copper substrates using chemical vapor deposition. The SEY tests were done at temperatures of 25℃ and vacuum pressure of (2-6)×10^-9 torr. The properties of the deposited graphene films were investigated by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. The SEY curves show that the number of graphene layers has a great effect on the SEY of graphene films. The maximum SEY of graphene films decreases with the increase of the number of layers. The maximum SEY of 6-8 layers of graphene film is 1.25. These results have a great significance for next-generation particle accelerators.

HTML

Reference (21)

Secondary electron emission characteristics of graphene films with copper substrate

Abstract：

References

Access

Article Metrics

Metrics

通讯作者: 陈斌, bchen63@163.com

Email This Article