Preliminary result of bunch length measurement using a modified Michelson interferometer
- Received Date: 2008-12-28
- Accepted Date: 2009-04-27
- Available Online: 2009-10-05
Abstract:
Based on the femtosecond accelerator device which was built at the Shanghai Institute of Applied Physics (SINAP), recently a modified far infrared Michelson interferometer has been developed to measure the length of electron bunches via the optical autocorrelation method. Compared with our former normal Michelson interferometer, we use a hollow retroreflector instead of a flat mirror as the reflective mirror. The experimental setup and results of the bunch length measurement will be described in this paper.