A new technique to measure the differential XAFS spectrum

Min Wu; Li-Rong Zheng; Sheng-Qi Chu; Ai-Yu Zhou; Jing Zhang; Tian-Dou Hu

doi:10.1088/1674-1137/40/4/048001

Chinese Physics C> 2016, Vol. 40> Issue(4) : 048001 DOI: 10.1088/1674-1137/40/4/048001

A new technique to measure the differential XAFS spectrum

Min Wu ^1,2 ,
Li-Rong Zheng ¹ ,
Sheng-Qi Chu ¹ ,
Ai-Yu Zhou ¹ ,
Jing Zhang ¹ ,
Tian-Dou Hu ^1,,

1.
Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
2.
Institute of Materials, Chinese Academy of Engineering Physics, P. O. Box 9071, Jiangyou 621907, China
3.
Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China

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Abstract：
A new technique has been developed for direct measurement of the differential X-ray absorption fine structure(XAFS) spectrum by the energy-modulation method. To acquire the energy-oscillating incident X-ray beam, a piezoelectric actuator is used to control the double-crystal monochromator. A logarithmic converter circuit and a lock-in amplifier are used to extract the modulated signals. The normal and differential XAFS spectra of the Mn K-edge of Li₂MnO₃ have been collected. The X-ray-absorption near-edge-structure(XANES) spectra verify that the signal-to-noise ratio has been greatly improved by the new technique, and the extended X-ray absorption fine structure(EXAFS) spectra demonstrate that this new technique can efficiently enhance the signals of the backscattering atoms.
- differential XAFS ,
- energy modulation ,
- monochromator

References

[1]	P. A. Lee, P. H. Citrin, P. Eisenberger et al, Rev. Mod. Phys., 53:769(1981)
[2]	J. J. Rehr and R. C. Albers, Rev. Mod. Phys., 72:621(2000)
[3]	W. E. Engeler, H. Fritzsch, M. Garfinke et al, Phys. Rev. Lett., 14:1069(1965)
[4]	J. L. Shay, Phys. Rev. B, 2:803(1970)
[5]	D. E. Aspnnes and A. A. Studna, Phys. Rev. B, 7:4605(1973)
[6]	K. Okamoto, K. Kohdate, K. Nagai et al, J. Synchrot. Radiat., 10:242(2003)
[7]	R. F. Pettifer, O. Mathon, S. Pascarelli et al, Nature, 435:78(2005)
[8]	M. P. Ruffoni, R. F. Pettifer, S. Pascarelli et al, J. Synchrot. Radiat., 14:421(2007)
[9]	S. Q. Chu, L. R. Zheng, Y. L. Zhou et al, J. Synchrot. Radiat., 18:728(2011)
[10]	S. Q. Chu, L. R. Zheng, R. Z. Che et al, Chin. Phys. C, 36:184(2012)
[11]	M. Suzuki, N. Kawamura, and T. Ishikawa, Nucl. Instrum. Methods, Phys. Res. A, 467:1568(2001)
[12]	A. Mandelis, Rev. Sci. Instrum., 65:3309(1994)
[13]	K. L. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Lett., 15:883(1965)
[14]	M. Taguchi, J. C. Parlebas, T. Uozumi et al, Phys. Rev. B, 61:2553(2000)
[15]	D. E. Sayers, E. A. Stern, and F. W. Lytle, Phys. Rev. Lett., 27:1204(1971)

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Min Wu, Li-Rong Zheng, Sheng-Qi Chu, Ai-Yu Zhou, Jing Zhang and Tian-Dou Hu. A new technique to measure the differential XAFS spectrum[J]. Chinese Physics C, 2016, 40(4): 048001. doi: 10.1088/1674-1137/40/4/048001

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Received: 2015-09-10
Revised: 2015-12-14

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Supported by NSFC(11175202)

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1.
沈阳化工大学材料科学与工程学院沈阳 110142

A new technique to measure the differential XAFS spectrum

Corresponding author: Tian-Dou Hu,

1. Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
2. Institute of Materials, Chinese Academy of Engineering Physics, P. O. Box 9071, Jiangyou 621907, China
3. Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China

Received Date: 2015-09-10
Accepted Date: 2015-12-14
Available Online: 2016-03-28

Fund Project: Supported by NSFC(11175202)

Abstract: A new technique has been developed for direct measurement of the differential X-ray absorption fine structure(XAFS) spectrum by the energy-modulation method. To acquire the energy-oscillating incident X-ray beam, a piezoelectric actuator is used to control the double-crystal monochromator. A logarithmic converter circuit and a lock-in amplifier are used to extract the modulated signals. The normal and differential XAFS spectra of the Mn K-edge of Li₂MnO₃ have been collected. The X-ray-absorption near-edge-structure(XANES) spectra verify that the signal-to-noise ratio has been greatly improved by the new technique, and the extended X-ray absorption fine structure(EXAFS) spectra demonstrate that this new technique can efficiently enhance the signals of the backscattering atoms.