Dependence on Temperature and Voltage of MRPC Noise and Dark Current

ZHAO Yan-E; WANG Xiao-Lian; LIU Hai-Dong; CHEN Hong-Fang; LI Cheng; WU Jian; XU Zi-Zong; SHAO Ming; ZENG Hui; ZHOU Yi

Chinese Physics C> 2004, Vol. 28> Issue(11) : 1193-1196

Dependence on Temperature and Voltage of MRPC Noise and Dark Current

Department of Modern Physics,University of Science and Technology of China,Hefei 230026,China

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Abstract：
With different gas mixtures and high voltage, the temperature dependence of the noise and dark current for a 6-gap Multi-gap Resistive Plate Chamber (MRPC) is measured, and they are found to increase exponentially with the increase of temperature.

References

[1]

. Zeballos E et al. Nucl. Instrum. Methods, 1996, A374(1): 132—1352. LI Cheng et al. HEP NP, 2001, 25(9): 933—936(in Chinese)(李澄等. 高能物理与核物理, 2001, 25(9): 933—936)3. CHEN Hong-Fang et al. HEP NP, 2002, 26(3): 201(in Chinese)(陈宏芳等. 高能物理与核物理, 2002, 26(3): 201)4. LI Cheng et al. HEP NP, 2002, 26(5): 455(in Chinese)(李澄等. 高能物理与核物理, 2002, 26(5): 455)5. SHAO M, RUAN L J et al. Nucl. Instrum. Methods, 2002, A492: 344-3506. Geurts F, Ming S, Bonner B et al. Proceeding of RPC 2003

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ZHAO Yan-E, WANG Xiao-Lian, LIU Hai-Dong, CHEN Hong-Fang, LI Cheng, WU Jian, XU Zi-Zong, SHAO Ming, ZENG Hui and ZHOU Yi. Dependence on Temperature and Voltage of MRPC Noise and Dark Current[J]. Chinese Physics C, 2004, 28(11): 1193-1196.

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Received: 2004-03-27
Revised: 1900-01-01

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