Dependence on Temperature and Voltage of MRPC Noise and Dark Current

ZHAO Yan-E; WANG Xiao-Lian; LIU Hai-Dong; CHEN Hong-Fang; LI Cheng; WU Jian; XU Zi-Zong; SHAO Ming; ZENG Hui; ZHOU Yi

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《中国物理C》（英文）编辑部

2024年10月30日

Chinese Physics C> 2004, Vol. 28> Issue(11) : 1193-1196

Dependence on Temperature and Voltage of MRPC Noise and Dark Current

Department of Modern Physics,University of Science and Technology of China,Hefei 230026,China

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Abstract：
With different gas mixtures and high voltage, the temperature dependence of the noise and dark current for a 6-gap Multi-gap Resistive Plate Chamber (MRPC) is measured, and they are found to increase exponentially with the increase of temperature.

References

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ZHAO Yan-E, WANG Xiao-Lian, LIU Hai-Dong, CHEN Hong-Fang, LI Cheng, WU Jian, XU Zi-Zong, SHAO Ming, ZENG Hui and ZHOU Yi. Dependence on Temperature and Voltage of MRPC Noise and Dark Current[J]. Chinese Physics C, 2004, 28(11): 1193-1196.

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Received: 2004-03-27
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Dependence on Temperature and Voltage of MRPC Noise and Dark Current

Corresponding author: WANG Xiao-Lian,

Department of Modern Physics,University of Science and Technology of China,Hefei 230026,China

Received Date: 2004-03-27
Accepted Date: 1900-01-01
Available Online: 2004-11-05

Abstract: With different gas mixtures and high voltage, the temperature dependence of the noise and dark current for a 6-gap Multi-gap Resistive Plate Chamber (MRPC) is measured, and they are found to increase exponentially with the increase of temperature.