Experimental studies on FeS<SUB>2</SUB> films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

ZHANG Hui; WANG Bao-Yi; ZHANG Zhe; WANG Ping; WEI Long; JIA Quan-Jie; WANG Yu-Zhu

Chinese Physics C> 2005, Vol. 29> Issue(S1) : 32-36

Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

Key Laboratory of Nuclear Analysis Techniques,Institute of High Energy Physics,CAS,Beijing 100049,China2 Beijing Synchrotron Radication Laboratory,Institute of High Energy Physics,CAS,Beijing 100049,China

Abstract
HTML
Reference
Related

PDF

Abstract：
Both conventional X-ray diffraction (XRD) and synchrotron radiation surface X-ray diffraction methods were used to study FeS₂ films prepared by magnetron sputtering on Si (100) and glass substrates for comparison. The results show that the preferred orientation of FeS₂ along (311) direction, which might be due to the well-matched crystal lattice for FeS₂ and Si (100), is mistaken. The peak at about 56°with extremely strong intensity comes from the (311) crystal plane of the silicon substrate, other than the preferred orientation of FeS₂. The conclusion is proved by both calculation and experimental measurements in present paper.

References

[1]

. Ennaoui A, Fiechter S, Goslowsky H et al. J. Electrochem.Soc., 1985, 132: 15792. Ferrer I J, Nevskaia D M, de Las Heras C et al. Solid StateCommun., 1990, 74: 9133. Ennaoui A, Fiechter S, Hopfner C et al. Sol. Energy Mater.Sol. Cells, 1993, 29: 2894. Birkholz M, Lichtenberger D, Hopfner C et al. Sol. EnergyMater. Sol. Cells,1992, 27: 2435. WU R, ZHENG Y F, ZHANG X G et al. Journal of CrystalGrowth, 2004, 266: 523—5276. BronoldM, Kubala S, Pettenkofer C et al. Thin Solid Films,1997, 304: 1787. Sasaki Y, Sugii S, Ishii K et al. J. Mater. Sci. Lett., 1999,18: 11938. Reijnen L, Meester B, Goossens A et al. J. Electrochem.Soc., 2000, 147: 18039. MENG L, LIU Y H, TIAN L et al. Journal of CrystalGrowth, 2003, 253: 530—53810. Ferrer I J, Snchez C. J. Appl. Phys., 1991, 70: 264111. de Las Heras C, Ferrer I J, Snchez C. J. Appl. Phys., 1993,74: 455112. Naoyuki Takahashi, Takuma Yatomi, Takato Nakamura.Solid State Sciences, 2004, 6: 1269—127213. Oertel J, Ellmer K, Bohne W et al. Journal of CrystalGrowth, 1999, 198-199: 1205—121014. WAN Dong-Yun, HE Qing, ZHANG Li-Peng. Journal ofCrystal Growth, 2004, 268: 222—22615. WAN D Y, WANG Y T, WANG B Y. J. Crystal Growth,2005, 53: 230

[1]	YUAN Qing-Xi , WANG Jun-Yue , ZHU Pei-Ping , HUANG Wan-Xia , SHU Hang , HU Tian-Dou , WU Ziyu . Computed Tomography Using Peak-Position Image of Diffraction Enhanced Imaging. Chinese Physics C, 2005, 29(10): 1023-1026.
[2]	GONG Yan , CHEN Bo , NI Qi-Liang , CUI Ming-Qi , ZHAO Yi-Dong , WU Zhong-Hua . Thickness Analysis for Thin-Film by Glazing Exit X-ray Fluorescence With Synchrotron Radiation Source. Chinese Physics C, 2005, 29(11): 1104-1106.
[3]	SHEN Da-Wa , YU Hui , WU Zong-Hua , HUANG Yong . The Morphology of CDA-g-PMMA Copolymers in Solution Studied by SR-SAXS. Chinese Physics C, 2005, 29(S1): 8-11.
[4]	CHEN Jun , WANG Jian-Feng , ZHANG Ji-Cai , WANG Hui , HUANG Yong , WANG Yu-Tian , YANG Hui , JIA Quan-Jie . Study on the stacking faults in hexagonal GaN grown by epitaxy lateral overgrowth with synchrotron radiation. Chinese Physics C, 2005, 29(S1): 37-39.
[5]	ZHU Jie , CUI Ming-Qi , ZHENG Lei , ZHAO Yi-Dong , WANG Zhan-Shan . Multilayer Polarizing Elements for Synchrotron Radiation Soft X-Ray Region. Chinese Physics C, 2004, 28(8): 893-897.
[6]	ZHENG Lei , CUI Ming-Qi , ZHU Jie , ZHAO Yi-Dong . Determination of the Photoabsorption Cross-Sections of Al and Fe Films in the Soft X-Ray Region Using Synchrotron Radiation. Chinese Physics C, 2004, 28(10): 1121-1125.
[7]	ZHENG Lei , CUI Ming-Qi , ZHAO Yi-Dong , ZHU Jie , ZHU Pei-Ping . Research of Photoionization Cross-Section of Argon in Soft X-Ray Region of Synchrotron Radiation. Chinese Physics C, 2003, 27(6): 555-558.
[8]	LI Xian-Liang , PAN Gang , QIN Yan-Wen , HU Tian-Dou , WU Zi-Yu , XIE Ya-Ning , CHEN Hao , DU Yong-Hua . EXAFS Studies on Adsorption Microscopic Structures of Zn at Manganite-Water Interaface and δ-MnO₂-Water Interaface. Chinese Physics C, 2003, 27(S1): 23-27.
[9]	ZHOU Chun-Lan , WANG Dan-Ni , HE Chuang-Xin , WANG Bao-Yi , WEI Long , HE Qing , JIA Quan-Jie . Study on Pores and Defect by Synthrotron Radiation Small Angle Reflection Method and Slow Positron Annihilation Technique. Chinese Physics C, 2003, 27(S1): 67-71.
[10]	CHEN Zhi-Hua , PAN Lin , LI Gang , XU Mei , XU Bo , ZHAO Tian-De , CHEN Wei-Chang , TANG Jin-Tian . Phase-Contrast Imaging with Synchrotron X-ray for Mouse Lung. Chinese Physics C, 2003, 27(S1): 83-85.
[11]	ZHENG Wen-Li , JIA Quan-Jie , JIANG Xiao-Ming , JIANG Zui-Min . Study of Ge Thin Heterostructures by Synchrotron Radiation X-Ray Reflection. Chinese Physics C, 2001, 25(12): 1231-1237.
[12]	PENG Liang-Qiang , YI Fu-Ting , HAN Yong , ZHANG Ju-Fang . Study on Synchrotron Radiation Lithography at BSRF. Chinese Physics C, 2001, 25(S1): 128-130.
[13]	GUO Hong-Xia , CHEN Yu-Sheng , ZHANG Yi-Men , ZHOU Hui , HAN Fu-Bin , GUAN Ying , GONG Jian-Chen . Experimental Study of X-Ray Induced Dose Enhancement Effect Using Synchrotron Radiation. Chinese Physics C, 2001, 25(S1): 1-6.
[14]	ZHANG DongQing , CUI MingQi , ZHU PeiPing , ZHAO YiDong , CUI CongWu . Self-calibration of Silicon Photodiode in the Soft X Ray Spectral Range. Chinese Physics C, 2000, 24(6): 578-584.
[15]	JIANG XiaoMing , JIA QuanJie , ZHENG WenLi , LIU Peng , XIAN DingChang , JIANG ZuiMin , WANG Xun . Development of Synchrotron Radiation X-Ray Grazing Incident Diffraction Method. Chinese Physics C, 2000, 24(12): 1185-1190.
[16]	Jiang Jianhua , Wang Zhouguang , Tian Yulian , Wang Gongli , Zhao Yang , Cao Mang , Li Dacheng , , . Study of X-Ray Interference Using Synchrotron Radiation. Chinese Physics C, 1998, 22(8): 763-767.
[17]	Wu Yingrong , Chao Zhiyu , Pan Juxiang , Hong Rong , Xiao Yanan , Li Guangcheng , Huang Yuying , Zhao Limin . Microprobe X-Ray Fluoresceoce Experintental Station of Beijing Syochrotron Radiation Facility. Chinese Physics C, 1997, 21(5): 475-480.
[18]	Jiang Xiaoming , Jing Yuhui , Zheng Wenli , Xiu Lisong , Wu Jinyang , Liu Gongchun . X-Ray Diffuse Scattering Station at BSRF and Study on Nonspecular X-Ray Scattering From Quasiperiodic Amorphous Multilayer. Chinese Physics C, 1996, 20(5): 460-467.
[19]	Wang Dewu , Liu Jianfei . Application of BSRF X-Ray Diffraction Station to Researches in Material Science. Chinese Physics C, 1995, 19(5): 473-478.
[20]	ZHAO Ji-Yong , YANG Ping , JIANG Jian-Hua , TIAN Yu-Lian , HAN Yong , WANG Chun-Xi , SHI Cai-Tu , XIAN Ding-Chang . Light Source for Synchrotron Radiation X-Ray Topography Study at Beijing Syncrotron Radiation Laboratory (BSRL). Chinese Physics C, 1992, 16(8): 679-684.

Access

Get Citation

ZHANG Hui, WANG Bao-Yi, ZHANG Zhe, WANG Ping, WEI Long, JIA Quan-Jie and WANG Yu-Zhu. Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method[J]. Chinese Physics C, 2005, 29(S1): 32-36.

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 2005-10-28
Revised: 1900-01-01

Article Metric

Article Views(3282)
PDF Downloads(718)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

Corresponding author: ZHANG Hui,

Key Laboratory of Nuclear Analysis Techniques,Institute of High Energy Physics,CAS,Beijing 100049,China2 Beijing Synchrotron Radication Laboratory,Institute of High Energy Physics,CAS,Beijing 100049,China

Received Date: 2005-10-28

Accepted Date: 1900-01-01

Available Online: 2005-01-02

Abstract: Both conventional X-ray diffraction (XRD) and synchrotron radiation surface X-ray diffraction methods were used to study FeS₂ films prepared by magnetron sputtering on Si (100) and glass substrates for comparison. The results show that the preferred orientation of FeS₂ along (311) direction, which might be due to the well-matched crystal lattice for FeS₂ and Si (100), is mistaken. The peak at about 56°with extremely strong intensity comes from the (311) crystal plane of the silicon substrate, other than the preferred orientation of FeS₂. The conclusion is proved by both calculation and experimental measurements in present paper.

HTML

Reference (1)

Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

Abstract：

References

Access

Article Metrics

Metrics

通讯作者: 陈斌, bchen63@163.com

Email This Article

Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

Corresponding author: ZHANG Hui,

HTML

目录

Experimental studies on FeS2 films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

Abstract：

References

Access

Article Metrics

Metrics

通讯作者: 陈斌, bchen63@163.com

Email This Article

Experimental studies on FeS2 films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

Corresponding author: ZHANG Hui,

HTML

目录

Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method

Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method