High Energy Resolution Position Sensitive Spectrometer With a Flat-Crystal

Hu Zhaohui; Liu Shijie; Liu Pingsheng; Xia Zonghuang; Feng Guohua; Yao Ying; Liu Zhuhua; Xu Yingting; Dong Yulan; Ni Jingkuan; Liu Cong

Chinese Physics C> 1999, Vol. 23> Issue(7) : 723-727

High Energy Resolution Position Sensitive Spectrometer With a Flat-Crystal

Institute of High Energy Physics, The Chineses Academy of Sciences, Beijing 1000801 Department of Technical Physics,Peking University Beijing, 1008712 China Institute of Atomic Energy, Beijing 102413

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Abstract：
Wavelength dispersive posihon sensitive spectrometer(PSS)with a flaterystal is a new type of high energy resolution equipment for analyzing X rays. It can be used in study of elemental analysis, chemical states and atomic physics. The paper describes the performance of PSS developed by us as well as the principle of PSS and its core part-position sensitive proportional counter. The energy resolution of 25eV, 15eV and 7eV have been obtained for 55Fe, Ti and Si, respectively, using developed PSS. Such resolution can meet the requirement in elements analyses.

References

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Hitachi A et al. Nucl. Instr. Meth., 1982, 195:631 2 Meada K et al. Inter. J. of PIXE, 1996, 6: 1173 Tesauro P et al. Nucl. Instr. Meth., 1996, B108: 1974 Budnar M et al. Inter. J. of PIXE, 1996, 6:51 5 Meada K et al. Inter. J of PIXE, 1992, 2:196 Folkmann F. Nucl. Instr. Math., 1993, B75:9 7 Zhang C H et al. Pays. Rev., 1989, B39:4796 8 Cindro V et al. J. Phys., 1989, B22:2161 9 Moknno Y et al. Nucl. Instr. Meth., 1997, B130:24310 Ishii K et al. Vacuum, 1987, 39:97 11 Hamanaka H et al. Inter. J. of PIXE, 1992, 2: 141 12 Callcott T A et al. Rev. Sci. Inst., 1986, 57:2680 13 Hu Z et al. Nucl. Instr. Meth. 1993, B74:426 14 Watson R L et al. Nucl. Instr. Meth., 1977, 142:311

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Hu Zhaohui, Liu Shijie, Liu Pingsheng, Xia Zonghuang, Feng Guohua, Yao Ying, Liu Zhuhua, Xu Yingting, Dong Yulan, Ni Jingkuan and Liu Cong. High Energy Resolution Position Sensitive Spectrometer With a Flat-Crystal[J]. Chinese Physics C, 1999, 23(7): 723-727.

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Received: 1998-05-16
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

High Energy Resolution Position Sensitive Spectrometer With a Flat-Crystal

Corresponding author: Hu Zhaohui,

Institute of High Energy Physics, The Chineses Academy of Sciences, Beijing 1000801 Department of Technical Physics,Peking University Beijing, 1008712 China Institute of Atomic Energy, Beijing 102413

Received Date: 1998-05-16
Accepted Date: 1900-01-01
Available Online: 1999-07-05

Abstract: Wavelength dispersive posihon sensitive spectrometer(PSS)with a flaterystal is a new type of high energy resolution equipment for analyzing X rays. It can be used in study of elemental analysis, chemical states and atomic physics. The paper describes the performance of PSS developed by us as well as the principle of PSS and its core part-position sensitive proportional counter. The energy resolution of 25eV, 15eV and 7eV have been obtained for 55Fe, Ti and Si, respectively, using developed PSS. Such resolution can meet the requirement in elements analyses.