Study on Extraction Method of Phase Information in X-Ray Diffraction Enhanced Imaging
- Received Date: 2005-10-31
- Accepted Date: 1900-01-01
- Available Online: 2005-01-02
Abstract: X-ray diffraction enhanced imaging (DEI) based on synchrotron radiation is effectively applied to the inspection of internal structures of weakly absorbing low-Z samples, such as soft issue. Its key problem is how to extract refractive angle images, which reflect phase gradients in samples, from DEI images. Geometric-optics approximation methods and statistical methods of multiple images are investigated in this paper. Then a new extraction method, named `statistical-geometric-optics approximation', is brought forward. It is validated by experiments at BSRF and proved that it can improve the exactness of geometric-optics approximation solutions and the Signal to Noise Ratio (SNR) of refractive angle images.





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