Measurement and Calculation of Escape Peak in SR-XRF Analysis

KANG Shi-Xiu; SUN Xia; YAO Kun; WU Zi-Qin; HUANG Yu-Ying; JU Xin; XIAN Ding-Chang

Chinese Physics C> 2001, Vol. 25> Issue(S1) : 39-43

Measurement and Calculation of Escape Peak in SR-XRF Analysis

Department of Astronomy and Applied Physics,University of Science and Technology of China,Hefei 230026,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

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Abstract：
The escape peaks in synchrotron radiation X-ray fluorescence (SR-XRD) spectra generating from Si(Li) detector can disrupt seriously the qualitative and quantitative analysis.Discrimination to escape peaks in experiments was performed.The escape peak position and intensity of 12 elements from K K_α to As K_α,for each of the 14 specimens,are measured.The differences of standard and experimental values of escape peak and the nearest major peak are compared.The errors are less than 10% in general.The ratios of intensity of escape peak and major peak are calculated using a simplified emitting distribution model of Si K_α excited by X-ray.The ratios,both calculated and experimental,descend approximately from 1% to 0.1% with the atom ordinal number increasing.

References

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K Janssens, Microscopic X-ray Fluorescence Analysis., London:Wiley. 2000.315-3422 HUANG Y Y, ZHAO L M, WANG Z G et al. Inter. J. PIXE, 1999,9(3-4): 1753 SHEN Xian-Sheng, SUN LiGuang, YIN Xue-Bin et al. Chinese J. Polar Research, 2001,13(1):50 (in Chinese)(沈显生，孙立广，尹学斌等.极地研究，2001,13(1):50)4 KANG Shi-Xiy SHEN Xian-Sheng, YAO Kun et al. Regress in Natural Science,2001.1l(10): 1050-1054 (in Chinese)(康士秀，沈显生，姚琅等.自然科学进展，2001, 11(10):1050-1054)5 YAO Kun, KANG Shi-Xiu, SUN Xia et al. Physics, 2002,31(2):105-112 (in Chinese)(姚现，康士秀，孙霞等.物理，2002,31(2):105-112)6 Jr Sparks C J. 1n:Synchrotron Radiation Research, Edited by H. Winick, S. Doniach,New York:Plenum Press, 1980,4595127 Van Espen P, Nullens H, Adams F. NIM, 1977,1422438 Heinrich R F J. Mass Absorption Coefficients for Flectron Probe Microanalysis. In: Brown J. D. Ed., l lth Int Conf. On X-ray optics and Microanalysis, London: 1986. 74-76

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KANG Shi-Xiu, SUN Xia, YAO Kun, WU Zi-Qin, HUANG Yu-Ying, JU Xin and XIAN Ding-Chang. Measurement and Calculation of Escape Peak in SR-XRF Analysis[J]. Chinese Physics C, 2001, 25(S1): 39-43.

KANG Shi-Xiu, SUN Xia, YAO Kun, WU Zi-Qin, HUANG Yu-Ying, JU Xin and XIAN Ding-Chang. Measurement and Calculation of Escape Peak in SR-XRF Analysis[J]. Chinese Physics C, 2001, 25(S1): 39-43. shu

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Received: 1900-01-01
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Measurement and Calculation of Escape Peak in SR-XRF Analysis

Corresponding author: KANG Shi-Xiu,

Department of Astronomy and Applied Physics,University of Science and Technology of China,Hefei 230026,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

Received Date: 1900-01-01
Accepted Date: 1900-01-01
Available Online: 2001-06-22

Abstract: The escape peaks in synchrotron radiation X-ray fluorescence (SR-XRD) spectra generating from Si(Li) detector can disrupt seriously the qualitative and quantitative analysis.Discrimination to escape peaks in experiments was performed.The escape peak position and intensity of 12 elements from K K_α to As K_α,for each of the 14 specimens,are measured.The differences of standard and experimental values of escape peak and the nearest major peak are compared.The errors are less than 10% in general.The ratios of intensity of escape peak and major peak are calculated using a simplified emitting distribution model of Si K_α excited by X-ray.The ratios,both calculated and experimental,descend approximately from 1% to 0.1% with the atom ordinal number increasing.