Invetisgation of Thermal Emittance Measurement in RF Photoinjector

LI Zheng-Hong

Chinese Physics C> 2005, Vol. 29> Issue(6) : 615-618

Invetisgation of Thermal Emittance Measurement in RF Photoinjector

LI Zheng-Hong ^,

Science College,South-West University of Science and Technology,MiangYang,621021 China

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Abstract：
A new method for the measurement of the thermal emittance in the RF photoinjector is introduced in the paper. The measurements are affected mainly by three factors which are the RF effect, the space charge affect and the error of measurements. According to the theory of emittance growth in the RF photoinjector and the simulation, a new method to eliminate the RF effect is proposed for the thermal emittance measurements in RF photoinjector. Error of measurements is not included , and the space charge effect is also ignored on the condition of the low charge operation mode.

References

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LI Zheng-Hong. Invetisgation of Thermal Emittance Measurement in RF Photoinjector[J]. Chinese Physics C, 2005, 29(6): 615-618.

LI Zheng-Hong. Invetisgation of Thermal Emittance Measurement in RF Photoinjector[J]. Chinese Physics C, 2005, 29(6): 615-618. shu

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Received: 2004-04-27
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Invetisgation of Thermal Emittance Measurement in RF Photoinjector

LI Zheng-Hong ^,

Corresponding author: LI Zheng-Hong,

Science College,South-West University of Science and Technology,MiangYang,621021 China

Received Date: 2004-04-27
Accepted Date: 1900-01-01
Available Online: 2005-06-05

Abstract: A new method for the measurement of the thermal emittance in the RF photoinjector is introduced in the paper. The measurements are affected mainly by three factors which are the RF effect, the space charge affect and the error of measurements. According to the theory of emittance growth in the RF photoinjector and the simulation, a new method to eliminate the RF effect is proposed for the thermal emittance measurements in RF photoinjector. Error of measurements is not included , and the space charge effect is also ignored on the condition of the low charge operation mode.