High Precision Standard Testing System for DCCT

CHEN Bin; CHEN Su-Ying; CHENG Jian; ZHANG Jing

Chinese Physics C> 2008, Vol. 32> Issue(S1) : 43-45

High Precision Standard Testing System for DCCT

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Abstract：
In the BEPCⅡ, a great deal of DCCTs, with current output, are used as the measuring and feed-back units in power supplies. High Precision Standard Testing System for DCCT is designed and developed in order to detect and adjust the capability of DCCT. This testing system mainly consists of a PC computer, a 7.5 Digit Multimeter, a high precision DC current measuring system, and a high precision and stability power supply. The function and the structure of the testing system are simply analysed, and the test data are presented.

References

[1]	. Model 2010 7-1/2 Digit Low Noise Autorange Multimeter Data Sheet2. ULTRACC User Manual, HITEC. 20003. 16/18-Bit Self-Calibrating Serial/Byte DACPORT AD760 Data Sheet, AD. 19954. LTZ1000/LTZ1000A Ultra Precision Reference Data Sheet

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CHEN Bin, CHEN Su-Ying, CHENG Jian and ZHANG Jing. High Precision Standard Testing System for DCCT[J]. Chinese Physics C, 2008, 32(S1): 43-45.

CHEN Bin, CHEN Su-Ying, CHENG Jian and ZHANG Jing. High Precision Standard Testing System for DCCT[J]. Chinese Physics C, 2008, 32(S1): 43-45. shu

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Received: 2008-01-10
Revised: 1900-01-01

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

High Precision Standard Testing System for DCCT

Corresponding author: CHEN Bin,

Received Date: 2008-01-10
Accepted Date: 1900-01-01
Available Online: 2008-01-04

Abstract: In the BEPCⅡ, a great deal of DCCTs, with current output, are used as the measuring and feed-back units in power supplies. High Precision Standard Testing System for DCCT is designed and developed in order to detect and adjust the capability of DCCT. This testing system mainly consists of a PC computer, a 7.5 Digit Multimeter, a high precision DC current measuring system, and a high precision and stability power supply. The function and the structure of the testing system are simply analysed, and the test data are presented.