Study of the background in the experiments of inner-shell ionization of atoms by positron impact

AN Zhu; LIU Man-Tian; ZHU Jing-Jun

Chinese Physics C> 2008, Vol. 32> Issue(S2) : 270-273

Study of the background in the experiments of inner-shell ionization of atoms by positron impact

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Abstract：
One of main difficulties in the experiments of inner-shell ionization of atoms by positron impact near threshold energy region is the relatively high low-energy background, which is caused by the deposited part of energy in semi-conductor X-ray detectors of 0.511 MeV γ rays that are produced by positron annihilations in targets and target chamber. In this paper, by using the Monte Carlo method, we simulated the backgrounds for the X-ray detectors with the sensitive layer thickness of 0.3 mm and 3 mm in the case of 0.511 MeV γ rays impacting vertically on a Ti plate of 0.2 mm in thickness, and compared the simulation results with the experimental observations of the other research group and our own. Moreover, we also simulated the backgrounds for a simplified experimental setup in the case of 20 keV positrons impacting vertically on a thick Ti target and observed that the backgrounds for the X-ray detectors with the sensitive layer thickness of 0.3 mm and 3 mm, are very similar.

References

[1]

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AN Zhu, LIU Man-Tian and ZHU Jing-Jun. Study of the background in the experiments of inner-shell ionization of atoms by positron impact[J]. Chinese Physics C, 2008, 32(S2): 270-273.

AN Zhu, LIU Man-Tian and ZHU Jing-Jun. Study of the background in the experiments of inner-shell ionization of atoms by positron impact[J]. Chinese Physics C, 2008, 32(S2): 270-273. shu

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Received: 2008-07-17
Revised: 1900-01-01

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Study of the background in the experiments of inner-shell ionization of atoms by positron impact

Corresponding author: AN Zhu,

Received Date: 2008-07-17

Accepted Date: 1900-01-01

Available Online: 2008-01-03

Abstract: One of main difficulties in the experiments of inner-shell ionization of atoms by positron impact near threshold energy region is the relatively high low-energy background, which is caused by the deposited part of energy in semi-conductor X-ray detectors of 0.511 MeV γ rays that are produced by positron annihilations in targets and target chamber. In this paper, by using the Monte Carlo method, we simulated the backgrounds for the X-ray detectors with the sensitive layer thickness of 0.3 mm and 3 mm in the case of 0.511 MeV γ rays impacting vertically on a Ti plate of 0.2 mm in thickness, and compared the simulation results with the experimental observations of the other research group and our own. Moreover, we also simulated the backgrounds for a simplified experimental setup in the case of 20 keV positrons impacting vertically on a thick Ti target and observed that the backgrounds for the X-ray detectors with the sensitive layer thickness of 0.3 mm and 3 mm, are very similar.

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Study of the background in the experiments of inner-shell ionization of atoms by positron impact

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