Study of Feasibility on the Trace Element Analysis with High-Energy Resolution by PSS
- Received Date: 2002-05-24
- Accepted Date: 1900-01-01
- Available Online: 2003-03-05
Abstract: The paper presents the study of feasibility on the trace element analysis with high-energy resolution by PSS at synchrotron radiation as an exciting source. Results are that the absolute value of ~10-10g has been measured for elements of Ti and Cu in thin sample, the detection limit is about 1—10ppm order of magnitude for Cr in the substance of light base, and a well-proportional relation exists between the counts of net integrated area and the concentration of Cr in the samples of homogenized solution. These show that the PSS is feasible as a useful tool to analyze element with high-energy resolution.





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