Evaluation of Structural Parameters in Semicrystalline Polymer Three-Phase Systems by Small-Angle X-Ray Scattering
- Received Date: 2003-03-24
- Accepted Date: 1900-01-01
- Available Online: 2003-11-05
Abstract: The structural parameters in a semicrystalline polymer three-phase system have been evaluated using small angle X-ray scattering technique. The crystallinity and the lamellar thickness are not consistent with those in two-phase system. The analysis of some semicrystalline polymer samples indicates that the Bragg long period approaches to the sum of the correlation function long period and the thickness of the transition layer. It is also consistent with the conclusion that the interphase layers exist in semicrystalline polymers.





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