Emittance Measurement by Multi-Changing Focusing Strength

WANG Shu-Hong; YE Qiang; CAO Jian-She; MA Li; LIU Yu-Cheng; LE Qi; PEI Guo-Xi; ZHANG Jia-Fei

Chinese Physics C> 2002, Vol. 26> Issue(11) : 1184-1188

Emittance Measurement by Multi-Changing Focusing Strength

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039, China

Abstract
HTML
Reference
Related

PDF

Abstract：
Some advanced techniques to optimize the emittance measurement devices have been studied, such as thin lens approximation, multi changing focusing strength, optimizing the position of the profile monitor and software improvement for accurate data acquisition and effective processing. By applying these techniques to the emittance measurement for electron beam of BEPC Linac, the satisfactory measurement results have been obtained.

References

[1]	. Ross M et al.PAC 87,1987.7252. Seeman J T .Handbook of Accelerator Physics and Engineering.Singapore:World Scientific Publishing Co.Pte.Ltd.,1999,560 3. Assmann R et al.LIAR A Computer Program for the Modeling and Simulation of High Performance Linacs.SLAC/AP –103,April 1997

Access

Get Citation

WANG Shu-Hong, YE Qiang, CAO Jian-She, MA Li, LIU Yu-Cheng, LE Qi, PEI Guo-Xi and ZHANG Jia-Fei. Emittance Measurement by Multi-Changing Focusing Strength[J]. Chinese Physics C, 2002, 26(11): 1184-1188.

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 2002-01-22
Revised: 1900-01-01

Article Metric

Article Views(4256)
PDF Downloads(651)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

Emittance Measurement by Multi-Changing Focusing Strength

Corresponding author: WANG Shu-Hong,

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039, China

Received Date: 2002-01-22
Accepted Date: 1900-01-01
Available Online: 2002-11-05

Abstract: Some advanced techniques to optimize the emittance measurement devices have been studied, such as thin lens approximation, multi changing focusing strength, optimizing the position of the profile monitor and software improvement for accurate data acquisition and effective processing. By applying these techniques to the emittance measurement for electron beam of BEPC Linac, the satisfactory measurement results have been obtained.